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Open the Future
With Nano-x

NanoX’s ultra-precision testing and inspection technologies enable the handling of ultra-fine device regions below 10 micrometers (μm),

supporting the commercialization of next-generation technologies such as MicroLED and HBM.

Open the Future

With Nano-x

NanoX’s ultra-precision testing and inspection technologies enable the handling of ultra-fine device regions below 10 micrometers (μm),

supporting the commercialization of next-generation technologies such as MicroLED and HBM.

Relentless Innovation
in Technology

NanoX has independently developed ultra-fine device inspection and particle handling technologies based on NEMS (Nano-Electromechanical Systems), achieving the successful commercialization of world-leading MicroLED inspection equipment.

Driven by a spirit of continuous challenge, NanoX delivers proprietary technology solutions to address customers’ technical challenges in emerging fields where advanced technologies are essential.


Relentless Innovation
in Technology

NanoX has independently developed ultra-fine device inspection and particle handling technologies based on NEMS (Nano-Electromechanical Systems), achieving the successful commercialization of world-leading MicroLED inspection equipment.

Driven by a spirit of continuous challenge, NanoX delivers proprietary technology solutions to address customers’ technical challenges in emerging fields where advanced technologies are essential.

iEPt™

With the world’s first application of 

3D NEMS technology, 

NanoX sets the standard for the probe market.

iEPt™ (individual Elastic Probe technology), independently developed by NanoX, enables ultra-fine pitch implementation, 

making Electro Luminescence (EL) testing of MicroLED and semiconductor devices possible.

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iEPt™

With the world’s first application of 

3D NEMS technology, 

NanoX sets the standard for the probe market.



iEPt™ (individual Elastic Probe technology), independently developed by NanoX, enables ultra-fine pitch implementation, 

making Electro Luminescence (EL) testing of MicroLED and semiconductor devices possible.

NANO-X 190, Saneop-ro, Gwonseon-gu, Suwon-si, Gyeonggi-do, Republic of Korea

031-278-6473 / nanoex@nanoex.co.kr

Copyright 2024. All Right Reserved.

NANO-X 190, Saneop-ro, Gwonseon-gu, Suwon-si, Gyeonggi-do, Republic of Korea

031-278-6473 / nanoex@nanoex.co.kr

Copyright 2024. All Right Reserved.